性能测试弹簧探针

性能测试弹簧探针

Performance Test Spring Probe

Performance Test Spring Probe

老化测试弹簧探针

老化测试弹簧探针

Aging Test Spring Probe

Aging Test Spring Probe

老化测试探针

老化测试探针

Aging Test Probe

Aging Test Probe

异形弹簧探针

异形弹簧探针

Special-shaped Spring Probe

Special-shaped Spring Probe

B4 型探针兼容自动化测试设备，插拔损耗低，能显著提升大规模电子元件检测的效率与一致性。

B4 型探针适配自动化产线、损耗率低，是高效电子检测的实用工具。

B4 series probes are compatible with automated test equipment, with low insertion and extraction loss, greatly improving efficiency and consistency in large-scale component testing.

B4 series probes fit automated production lines with low loss, being a practical tool for efficient electronic testing.

非弹簧测试探针

非弹簧测试探针

Non-spring Test Probe

Non-spring Test Probe

M4 型探针兼容多规格测试治具，插拔顺畅且接触电阻低，能显著提升大规模工业检测的效率。

M4 型探针适配性广、接触可靠，是工业级电子测试的高性价比工具。

Non-spring Test Probe

Non-spring Test Probe

老化测试插座

老化测试插座是专用于芯片高温老化、高压应力测试的接口器件，是芯片可靠性验证环节的核心部件，主要适配芯片量产前的老化筛选（Burn-in Test）和可靠性评估场景。

Aging Test Socket

Aging Test Socket